Comparative experimental study of junctionless and inversion-mode nanowire transistors for analog applications

Autor: Benoit Sklenard, Joris Lacord, D. Lattard, R. Nait Youcef, Xavier Garros, A. Tataridou, Francois Andrieu, Claire Fenouillet-Beranger, F. Balestra, Sylvain Barraud, Perrine Batude, G. Audoit, Mikael Casse, D. Bosch, J. Lugo, Christoforos G. Theodorou, Laurent Brunet, J.-P. Colinge, J. Cluzel, F. Allain, C. Vizioz, J.M. Hartmann
Přispěvatelé: Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA)
Jazyk: angličtina
Rok vydání: 2020
Předmět:
Zdroj: 2020 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
2020 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA), Aug 2020, Hsinchu, Taiwan. pp.126-127, ⟨10.1109/VLSI-TSA48913.2020.9203690⟩
Popis: We fabricated junction less and inversion-mode monocrystalline nanowire nMOSFETs down to L=18nm gate length and W=20nm width. We demonstrate record performance of nanowire junction less transistors for analog applications: $A_{VT}=1.4mV \cdot \mu$ m matching, $A_{v0}=62dB$ gain (L=200nm), $f_{T}=126GHz$ cut-off frequency and $f_{MAX}=182GHz$ maximum operating frequency (L=35nm). Junction Less transistor performances even exceed those of inversion-mode ones in terms of back-bias capability, low-frequency noise, hotcarrier degradation and fMAX. This is explained by junction less physics: channel length modulation, bulk conduction and high channel-depth sensitivity to back bias.
Databáze: OpenAIRE