Site-specific electrical contacts with the two-dimensional materials
| Autor: | Thuc Hue Ly, Quoc Huy Thi, Fangyuan Zheng, Lok-Wing Wong, Jiong Zhao, Lingli Huang, Qingming Deng |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2020 |
| Předmět: |
0301 basic medicine
Materials science Electronic properties and materials Science General Physics and Astronomy 02 engineering and technology Conductivity Two-dimensional materials General Biochemistry Genetics and Molecular Biology Article law.invention 03 medical and health sciences law lcsh:Science Quantum tunnelling Multidisciplinary business.industry Graphene General Chemistry 021001 nanoscience & nanotechnology Electrical contacts Edge type In situ transmission electron microscopy 030104 developmental biology Semiconductor Optoelectronics lcsh:Q 0210 nano-technology business |
| Zdroj: | Nature Communications, Vol 11, Iss 1, Pp 1-10 (2020) Nature Communications |
| ISSN: | 2041-1723 |
| Popis: | Electrical contact is an essential issue for all devices. Although the contacts of the emergent two-dimensional materials have been extensively investigated, it is still challenging to produce excellent contacts. The face and edge type contacts have been applied previously, however a comparative study on the site-specific contact performances is lacking. Here we report an in situ transmission electron microscopy study on the contact properties with a series of 2D materials. By manipulating the contact configurations in real time, it is confirmed that, for 2D semiconductors the vdW type face contacts exhibit superior conductivity compared with the non-vdW type contacts. The direct quantum tunneling across the vdW bonded interfaces are virtually more favorable than the Fowler–Nordheim tunneling across chemically bonded interfaces for contacts. Meanwhile, remarkable area, thickness, geometry, and defect site dependences are revealed. Our work sheds light on the significance of contact engineering for 2D materials in future applications. Here, the authors use in situ transmission electron microscopy to measure the interface properties of electrical contacts with MoS2, ReS2, and graphene, and find that direct quantum tunnelling across van-der-Waals-bonded interfaces is more favourable than Fowler–Nordheim tunnelling across chemically bonded interfaces. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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