Distortion-free measurement of electric field strength with a MEMS sensor

Autor: Franz Kohl, Harald Steiner, Franz Keplinger, Johannes Schalko, Wilfried Hortschitz, Artur Jachimowicz, Roman Beigelbeck, Michael Stifter, Andreas Kainz
Rok vydání: 2018
Předmět:
Zdroj: Nature electronics
ISSN: 2520-1131
Popis: Small-scale and distortion-free measurement of electric fields is crucial for applications such as surveying atmospheric electrostatic fields, lightning research and safeguarding areas close to high-voltage power lines. A variety of measurement systems exist, the most common of which are field mills, which work by picking up the differential voltage of the measurement electrodes while periodically shielding them with a grounded electrode. However, all current approaches are bulky, suffer from a strong temperature dependency or severely distort the electric field, and thus require a well-defined surrounding and complex calibration procedures. Here we show that microelectromechanical system (MEMS) devices can be used to measure electric field strength without significant field distortion. The purely passive MEMS devices exploit the effect of electrostatic induction, which is used to generate internal forces that are converted into an optically tracked mechanical displacement of a spring-suspended seismic mass. The devices exhibit resolutions on the order of 100 V m−1 Hz−1/2 with a measurement range of up to tens of kilovolts per metre in the quasi-static regime ≲300 Hz). We also show that it should be possible to achieve resolutions of around 1 V m−1 Hz−1/2 by fine-tuning the sensor embodiment. These MEMS devices are compact and could be mass produced easily for wide application. The detection of force-induced displacements within compact MEMS (microelectromechanical system) devices can be used to measure electric field strength without significant field distortion.
Databáze: OpenAIRE
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