Contactless electromagnetic measuring system using conventional calibration algorithms to determine scattering parameters
Autor: | Hermann Eul, T. Zelder, Hanno Rabe |
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Jazyk: | angličtina |
Rok vydání: | 2018 |
Předmět: |
Engineering
Planar transmission lines Capacitive sensing ddc:621 3 Calibration algorithm Contactless measurement Electric network analyzers Electromagnetism Planar Electromagnetic probes Contactless measurement system Scattering parameters Calibration Electronic engineering Electro-optic probing Electronic circuit Coupling Design for testability business.industry System of measurement Measurements Dewey Decimal Classification::600 | Technik::620 | Ingenieurwissenschaften und Maschinenbau::621 | Angewandte Physik::621 3 | Elektrotechnik Elektronik General Medicine System characteristics Basic characteristics lcsh:TA1-2040 Probes lcsh:Engineering (General). Civil engineering (General) business Microwave |
Zdroj: | Advances in Radio Science, Vol 5, Pp 427-434 (2007) Advances in Radio Science 5 (2007) |
ISSN: | 1684-9973 |
Popis: | In this paper, a contactless measuring system for the determination of the S-parameters of planar circuits is presented. With a contactless measuring system it is possible to characterise a device-under-test (DUT) embedded in a planar circuit environment without cutting the planar transmission lines connecting the DUT. The technique utilizes four identical capacitive probes in conjunction with a vector network analyser (VNA). For the usage of electromagnetic probes compared to other coupling techniques like the electro-optic probing, there is no need for expensive and complex equipment in addition to the typical equipment of a common microwave laboratory. The S-parameters are determined accurately using conventional calibration methods. A simple analytical model for the representation of the basic characteristics is developed. Furthermore, the influences on the S-parameters as a result of a variation in the coupling are presented. With the knowledge of the system characteristics, an accurate contactless measurement system is set up. The comparison between conventional and contactless measurements in a frequency range of 1–20 GHz shows a very good agreement with a phase error smaller than 1°. |
Databáze: | OpenAIRE |
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