Mirror effect in atomic force microscopy profiles enables tip reconstruction
| Autor: | Elena Pinilla-Cienfuegos, Josep Canet-Ferrer, Alicia Forment-Aliaga, Francisco Marques-Moros |
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| Jazyk: | angličtina |
| Rok vydání: | 2020 |
| Předmět: |
Work (thermodynamics)
Materials science Nanoparticle lcsh:Medicine 02 engineering and technology 01 natural sciences Article Techniques and instrumentation Convolution Atomic force microscopy Optics 0103 physical sciences Dispersion (optics) lcsh:Science 010302 applied physics Multidisciplinary business.industry lcsh:R Process (computing) Radius 021001 nanoscience & nanotechnology Aspect ratio (image) Distribution (mathematics) Scanning probe microscopy lcsh:Q 0210 nano-technology business |
| Zdroj: | Scientific Reports, Vol 10, Iss 1, Pp 1-8 (2020) Scientific Reports |
| ISSN: | 2045-2322 |
| DOI: | 10.1038/s41598-020-75785-0 |
| Popis: | In this work, the tip convolution effect in atomic force microscopy is revisited to illustrate the capabilities of cubic objects for determination of the tip shape and size. Using molecular-based cubic nanoparticles as a reference, a two-step tip reconstruction process has been developed. First, the tip-to-face angle is estimated by means of an analysis of the convolution error while the tip radius is extracted from the experimental profiles. The results obtained are in good agreement with specification of the tip supplier even though the experiments have been conducted using real distribution of nanoparticles with dispersion in size and aspect ratio. This demonstrates the reliability of our method and opens the door for a more accurate tip reconstruction by using calibration standards. |
| Databáze: | OpenAIRE |
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