Autor: |
Thomas M. Fitzgerald, Michael A. Marciniak |
Rok vydání: |
2010 |
Předmět: |
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Zdroj: |
MEMS and Nanotechnology, Volume 2 ISBN: 9781441988249 |
ISSN: |
1662-0356 |
DOI: |
10.4028/www.scientific.net/ast.75.240 |
Popis: |
Artificial structures with sub-optical wavelength features are engineered to demonstrate material properties for optical and infrared permeability and permittivity not otherwise found in nature. Such artificial structures are referred to as optical and infrared metamaterials. The application space of electromagnetic metamaterials includes novel sub-wavelength waveguides and antennas, true time delay devices, optical filters, plasmonic electronic-optical interfaces, optical limiters and thermal management systems. In this paper, we present an optical diagnostic technique adapted for measuring and analyzing bidirectional polarimetric scatter from novel optical and infrared metamaterials of interest. This optical diagnostic technique is also broadly applicable to other optical/infrared metamaterial structures as well as other nanostructures such as plasmonic devices or photonic crystals that may be proposed or developed in the future. The specific project goals are a) Demonstrate a novel metamaterial characterization full-polarimetric diffuse ellipsometry technique suitable to measure desired material properties with stated uncertainty limits for novel optical and infrared metamaterials of interest. b) Demonstrate incorporation of predictive computational codes that estimate the electro-magnetic property values for metamaterial designs and concepts of interest. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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