Impedance-meter characterization of integrated magnetic planar devices at low frequencies for low power application
| Autor: | J. J. Rousseau, S. Capraro, D. A. Oumar, J. P. Chatelon, David Pietroy, M. I. Boukhari |
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| Přispěvatelé: | Laboratoire Hubert Curien [Saint Etienne] (LHC), Institut d'Optique Graduate School (IOGS)-Université Jean Monnet [Saint-Étienne] (UJM)-Centre National de la Recherche Scientifique (CNRS) |
| Jazyk: | angličtina |
| Rok vydání: | 2020 |
| Předmět: |
Materials science
Acoustics 020208 electrical & electronic engineering Electrical model 020206 networking & telecommunications Power application 02 engineering and technology Surfaces Coatings and Films Characterization (materials science) Dipole Planar Hardware and Architecture Signal Processing Quadrupole 0202 electrical engineering electronic engineering information engineering Physics::Accelerator Physics Metre [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics Electrical impedance ComputingMilieux_MISCELLANEOUS |
| Zdroj: | Analog Integrated Circuits and Signal Processing Analog Integrated Circuits and Signal Processing, Springer Verlag, 2020, 104 (3), pp.311-319. ⟨10.1007/s10470-020-01604-1⟩ |
| ISSN: | 0925-1030 1573-1979 |
| Popis: | In order to miniaturize components, planar technology has become essential. For frequency characterization of integrated quadrupole devices, only network vector analyzers can be used, but these instruments cannot be employed for frequencies below a few MHz. At these frequencies, only the impedance-meter allows devices to be measured. But, this instrument only measures dipole devices. Thus, the objective of this paper is to present a characterization method using an impedance-meter in order to characterize integrated quadrupole devices. The implemented method allows all elements of an electrical model of integrated component to be extracted with low uncertainties (less than 3%) over the entire study band. |
| Databáze: | OpenAIRE |
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