Ptychography for Nonlinear Optical Microscopy: Retrieving Phase without Interferometry
| Autor: | Jarno N. van der Kolk, Lora Ramunno |
|---|---|
| Rok vydání: | 2017 |
| Předmět: |
010302 applied physics
Materials science Nonlinear microscopy business.industry Resolution (electron density) Phase (waves) 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences Nonlinear optical microscopy Ptychography Nonlinear system symbols.namesake Interferometry Optics 0103 physical sciences symbols 0210 nano-technology business Raman scattering |
| Zdroj: | Optics in the Life Sciences Congress. |
| Popis: | The nonlinear susceptibility phase is obtained by adapting ptychography to nonlinear optical microscopy. We develop a reconstructive technique to retrieve phase from far-field diffractive images, obtaining enhanced resolution despite distorted input beams. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|