Designing a key performance indicator system for technological innovation audit at firm's level: A framework and an empirical study
Autor: | Jian-xin You, Hai-ao Zheng, Jean-Jacques Chanaron, Xiaoli Chen |
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Přispěvatelé: | Tongji University, Groupe d'Analyse et de Théorie Economique Lyon - Saint-Etienne (GATE Lyon Saint-Étienne), École normale supérieure de Lyon (ENS de Lyon)-Université Lumière - Lyon 2 (UL2)-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Université de Lyon-Université Jean Monnet - Saint-Étienne (UJM)-Centre National de la Recherche Scientifique (CNRS), Chemnitz University of Technology / Technische Universität Chemnitz, Dao, Taï, Groupe d'analyse et de théorie économique (GATE Lyon Saint-Étienne), Centre National de la Recherche Scientifique (CNRS)-Université de Lyon-Université Jean Monnet [Saint-Étienne] (UJM)-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Université Lumière - Lyon 2 (UL2)-École normale supérieure - Lyon (ENS Lyon) |
Jazyk: | angličtina |
Rok vydání: | 2009 |
Předmět: |
Knowledge management
business.industry Computer science key performance indicator system data analysis technological innovation audit Innovation management JEL: O - Economic Development Innovation Technological Change and Growth/O.O3 - Innovation • Research and Development • Technological Change • Intellectual Property Rights/O.O3.O32 - Management of Technological Innovation and R&D Questionnaire Audit [SHS.ECO]Humanities and Social Sciences/Economics and Finance Performance audit innovation performance audit Technology management Empirical research methodology framework performance measurement system [SHS.GESTION]Humanities and Social Sciences/Business administration Performance measurement Performance indicator business [SHS.ECO] Humanities and Social Sciences/Economics and Finance |
Zdroj: | IEEE International Conference on Industrial Engineering and Engineering Management IEEE International Conference on Industrial Engineering and Engineering Management, Dec 2009, Hong Kong, China. ⟨10.1109/IEEM.2009.5373498⟩ IEEE International Conference on Industrial Engineering and Engineering Management, Hong Kong, 6-9 December, 2009 IEEE International Conference on Industrial Engineering and Engineering Management, Hong Kong, 6-9 December, 2009, Dec 2009, Hong Kong, Hong Kong SAR China |
DOI: | 10.1109/IEEM.2009.5373498⟩ |
Popis: | This research aims at taking a further step in developing a methodology framework of innovation performance audit. With adopting the ideology of performance measurement system, a framework of key performance indicator(KPI) system including three level issues of ‘what is input’, ‘what is done’ and ‘what happens’ is designed for technological innovation audit, which can reflect the performance of technological innovation at firm's level comprehensively. Furthermore, a questionnaire survey on line is conducted to test the validity of the key performance indicator system. Based on data analysis, the KPI system is proved to be effective as a whole, of which most indicators not only are important, but also could be measured easily in firms. Finally, in-depth innovation performance audit of four hi-tech firms is taken as a case study to verify the validity of the KPI system. |
Databáze: | OpenAIRE |
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