| Autor: |
G. Julius Vancso, Simon Flink, David N. Reinhoudt, Frank C. J. M. van Veggel, Holger Schönherr, Frank A. J. Geurts, Kees van Leerdam |
| Přispěvatelé: |
Materials Science and Technology of Polymers, Faculty of Science and Technology |
| Rok vydání: |
2000 |
| Předmět: |
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| Zdroj: |
Journal of the Chemical Society. Perkin transactions II, 2000(10), 2141-2146. Chemical Society |
| ISSN: |
0300-9580 |
| DOI: |
10.1039/b002606i |
| Popis: |
X-Ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) have been used to study the interactions between self-assembled monolayers (SAMs) of crown ether adsorbates and metal ions. Both analytical techniques confirmed the selectivities of the 12-crown-4 and 15-crown-5 SAMs that had previously been determined by electrochemical impedance spectroscopy. AFM has also been used to characterize microcontact-printed crown ether monolayers. The electrochemical patterning of monolayers on gold allowed the design of a dual sensor for the electrochemical detection of cations. However, due to cross-contamination of both monolayers during the patterning process a significant selectivity reduction of the layers was observed. Nevertheless, the remaining Na+ selectivity of the 12-crown-4 SAM and the K+ selectivity of the 15-crown-5 SAM allowed the unambiguous discrimination between both metal ions. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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