Noise Considerations of Integrators for Current Readout Circuits
| Autor: | T. v. d. Boom, Armin Kemna, Bedrich Hosticka, Benjamin Bechen, M. Gnade |
|---|---|
| Přispěvatelé: | Publica |
| Rok vydání: | 2005 |
| Předmět: |
Engineering
Noise temperature Physics::Instrumentation and Detectors business.industry Electrical engineering Materialtechnik Hardware_PERFORMANCEANDRELIABILITY General Medicine Noise (electronics) Computer Science::Hardware Architecture Computer Science::Emerging Technologies CMOS Noise generator lcsh:TA1-2040 Integrator Hardware_INTEGRATEDCIRCUITS Electronic engineering Effective input noise temperature lcsh:Engineering (General). Civil engineering (General) business Charge amplifier AND gate Hardware_LOGICDESIGN |
| Zdroj: | Advances in Radio Science, Vol 3, Pp 331-336 (2005) |
| ISSN: | 1684-9973 |
| Popis: | In this paper the noise analysis of a current integrator is carried out and measures to reduce the overall noise are presented. The effects of various noise sources are investigated and their dependence on the input capacitance and on the gate area of the input transistors of the OTA used for the readout is shown. Both, input capacitance and gate area, should be kept as small as possible. Moreover, the linearity of the integrator is examined. In addition to that, the available application of such sensor readout circuit, which is a CMOS photodetector readout, is introduced. It uses an automatic gain switching, so that the dynamic range is extended. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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