Chemical force microscopy for hot-embossing lithography release layer characterization
Autor: | Arnaud Ott, Hélène Roberge, Teodor Veres, Neil S. Cameron |
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Rok vydání: | 2020 |
Předmět: | |
Zdroj: | Soft matter. 2(7) |
ISSN: | 1744-6848 |
Popis: | We employed variable temperature chemical force microscopy (VT-CFM) using tips silanized with four different hydro- and hydrofluoroalkyl self-assembling monolayers (SAMs) interacting with a thin-film of poly(cyclic olefin), (PCO) to model the hot-embossing stamp-polymer interaction over a temperature range spanning the glass transition of the PCO. |
Databáze: | OpenAIRE |
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