Chemical force microscopy for hot-embossing lithography release layer characterization

Autor: Arnaud Ott, Hélène Roberge, Teodor Veres, Neil S. Cameron
Rok vydání: 2020
Předmět:
Zdroj: Soft matter. 2(7)
ISSN: 1744-6848
Popis: We employed variable temperature chemical force microscopy (VT-CFM) using tips silanized with four different hydro- and hydrofluoroalkyl self-assembling monolayers (SAMs) interacting with a thin-film of poly(cyclic olefin), (PCO) to model the hot-embossing stamp-polymer interaction over a temperature range spanning the glass transition of the PCO.
Databáze: OpenAIRE