Progress in fabrication of high quality tantalum film absorber for STJ radiation detector
Autor: | Matteo Salvato, M. L. Della Rocca, Luigi Maritato, M.P. Lissitski, R. Cristiano, D. Perez de Lara |
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Rok vydání: | 2004 |
Předmět: |
Superconductivity
Physics Nuclear and High Energy Physics Fabrication business.industry Detector Tantalum chemistry.chemical_element Particle detector Condensed Matter::Materials Science Quality (physics) chemistry Aluminium Condensed Matter::Superconductivity Optoelectronics business Instrumentation superconducting tunnel junction detector epitaxial thin film growing residual resistance ratio Residual-resistance ratio |
Zdroj: | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT 520 (2004): 243–245. doi:10.1016/j.nima.2003.11.334 info:cnr-pdr/source/autori:M.P. Lissitski, D. Perez de Lara, R. Cristiano, M.L. Della Rocca, L. Maritato, M. Salvato/titolo:Progress in fabrication of high quality tantalum film absorber for STJ radiation detector/doi:10.1016%2Fj.nima.2003.11.334/rivista:NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT/anno:2004/pagina_da:243/pagina_a:245/intervallo_pagine:243–245/volume:520 |
ISSN: | 0168-9002 |
DOI: | 10.1016/j.nima.2003.11.334 |
Popis: | We report the fabrication and characterization of high quality tantalum films as absorbers for STJ radiation detectors. Values of the residual resistance ratio up to 75 and bulk value of the superconducting transition temperature T-c = 4.5 +/- 0.1 K have been achieved. Devices for detection with lateral aluminum superconducting tunnel junctions have been fabricated on such films. The detector response to X-ray is discussed. (C) 2003 Elsevier B.V. All rights reserved. |
Databáze: | OpenAIRE |
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