Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis

Autor: Jean-Roch Vaillé, Frédéric Wrobel, S. Jonathas, Vincent Pouget, R. Job, Frédéric Saigné
Přispěvatelé: Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Radiations et composants (RADIAC), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), PULSCAN
Jazyk: angličtina
Rok vydání: 2017
Předmět:
Engineering
ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION
Physics::Optics
02 engineering and technology
01 natural sciences
Synchronization
law.invention
Two-photon excitation microscopy
law
0103 physical sciences
0202 electrical engineering
electronic engineering
information engineering
Electronic engineering
Extraction (military)
Electrical and Electronic Engineering
Safety
Risk
Reliability and Quality
Absorption (electromagnetic radiation)
ComputingMilieux_MISCELLANEOUS
010308 nuclear & particles physics
business.industry
Fault injection
Condensed Matter Physics
Laser
Atomic and Molecular Physics
and Optics
020202 computer hardware & architecture
Surfaces
Coatings and Films
Electronic
Optical and Magnetic Materials
[SPI.TRON]Engineering Sciences [physics]/Electronics
Asynchronous communication
Frequency domain
business
Zdroj: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF) 2017
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF) 2017, 2017, Bordeaux, France
Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2017, 76-77, pp.650-654. ⟨10.1016/j.microrel.2017.07.028⟩
ISSN: 0026-2714
Popis: This paper presents a methodology for analysing two-photon absorption laser testing results in the frequency domain rather than with the classical mapping approach. We experimentally demonstrate, on a 28 nm device, the extraction of subwavelength dimensions from a noisy environment without requiring any synchronization between the test operations and the laser or the scan motion. A model of the experiment is then used to evaluate the impact of different parameters on the capabilities of the technique.
Databáze: OpenAIRE
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