The contact process as seen from a random walk
| Autor: | Stein Andreas Bethuelsen |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2016 |
| Předmět: |
Statistics and Probability
Discrete mathematics Contact process Probability (math.PR) 010102 general mathematics Process (computing) Random walk 01 natural sciences Infection rate ddc 010104 statistics & probability Jump rate Convergence (routing) FOS: Mathematics Jump 0101 mathematics Focus (optics) Mathematics - Probability Mathematics |
| Popis: | We consider a random walk on top of the contact process on $\mathbb{Z}^d$ with $d\geq 1$. In particular, we focus on the "contact process as seen from the random walk". Under the assumption that the infection rate of the contact process is large or the jump rate of the random walk is small, we show that this process has at most two extremal measures. Moreover, the convergence to these extremal measures is characterised by whether the contact process survives or dies out, similar to the complete convergence theorem known for the ordinary contact process. Using this, we furthermore provide a law of large numbers for the random walk which holds under general assumptions on the jump probabilities of the random walk. 15 pages + references |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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