| Autor: |
Charles Nielsen, V. Robertson, Natasha Erdman |
| Rok vydání: |
2012 |
| Předmět: |
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| Zdroj: |
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 18(6) |
| ISSN: |
1435-8115 |
| Popis: |
Previously, imaging and analysis with cathodoluminescence (CL) detectors required using high accelerating voltages. Utilization of lower accelerating voltage for microanalysis has the advantages of reduced beam-specimen interaction volume, and thus better spatial resolution, as well as reduction in electron beam induced damage. This article will highlight recent developments in field emission gun–scanning electron microscope technology that have allowed acquisition of high spatial resolution CL images at very low accelerating voltages. The advantages of low kV CL imaging will be shown using examples of a geological specimen (shale) and a specimen of an industrial grade diamond. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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