Autor: |
Zeru Wu, Siyuan Yu, Yujie Chen, Yanfeng Zhang, Yaozu Xie, Shihao Zeng, Jiaqi Li |
Rok vydání: |
2021 |
Předmět: |
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Zdroj: |
Optics Express. 29:29557 |
ISSN: |
1094-4087 |
DOI: |
10.1364/oe.438436 |
Popis: |
We report very low-loss deuterated silicon nitride (SiNx:D) micro-ring resonators fabricated by back-end CMOS compatible low-temperature plasma-enhanced chemical vapor deposition (PECVD) without annealing. Strong confinement micro-ring resonators with a quality factor of > 2 million are achieved, corresponding to a propagation loss in the 1460-1610 nm wavelength range of ∼ 0.17 dB/cm. We further report the generation of low-noise coherent Kerr microcomb states including different perfect soliton crystals (PSC) in PECVD SiNx:D micro-ring resonators. These results manifest the promising potential of the back-end CMOS compatible SiNx:D platform for linear and nonlinear photonic circuits that can be co-integrated with electronics. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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