Measurement of partial specific thickness (net thickness) of critical-point-dried cultured fibroblast by energy analysis
Autor: | Kiyoshi Hama, Jun Hosoi, Yasushi Kokubo, Masao Inoue, Tetsuo Oikawa |
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Rok vydání: | 1981 |
Předmět: |
Materials science
Spectrum Analysis Energy analyser Fibroblasts Cultured fibroblast Energy analysis Atomic and Molecular Physics and Optics Biological materials Electronic Optical and Magnetic Materials law.invention Crystallography Biological specimen Microscopy Electron Volume (thermodynamics) law Critical point (thermodynamics) Composite material Electron microscope Desiccation Instrumentation Cells Cultured |
Zdroj: | Ultramicroscopy. 7(2) |
ISSN: | 0304-3991 |
Popis: | The relative specimen thickness obtained with an energy analyser is one of the most important parameters in electron microscopy. It has been made clear that this parameter can be applied not only to inorganic specimens, but also to organic and biological specimens. Moreover, the partial specific thickness of a critical-point-dried cultured fibroblast, that is, a net thickness converted in terms of Epon, was calculated from the relative specimen thickness. The partial specific thickness of each domain of the critical-point-dried cultured fibroblast is: CC 0.05 microns, PE 0.14 microns, ED 0.32 microns and PN 0.54 microns. As a result, it is suggested that 27% of the volume of this specimen consists of biological materials. |
Databáze: | OpenAIRE |
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