Josephson effects in misaligned Tl-2212 films
| Autor: | David Dew-Hughes, Crm Grovenor, Mark G. Blamire, RJ Kinsey, W.E Booij, OS Chana, David Hyland, Paul A. Warburton |
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| Rok vydání: | 1999 |
| Předmět: |
Josephson effect
Superconductivity Copper oxide Materials science Condensed matter physics Energy Engineering and Power Technology Condensed Matter Physics Electronic Optical and Magnetic Materials Magnetic field Pi Josephson junction chemistry.chemical_compound chemistry Condensed Matter::Superconductivity Electrical and Electronic Engineering Thin film Vicinal Quantum tunnelling |
| Zdroj: | Physica C: Superconductivity. :104-110 |
| ISSN: | 0921-4534 |
| DOI: | 10.1016/s0921-4534(99)00482-7 |
| Popis: | We have measured Josephson RSJ-like static current-voltage characteristics in 2-mu m-wide bridges patterned in the [cos 20 degrees 0 sin 20 degrees] direction in 200 degrees misaligned thin films of Tl2Ba2CaCu2O8 grown on vicinal LaAlO3 substrates. The temperature dependence of the critical current of the bridge is well-described by Josephson SIS tunnelling between two BCS superconductors, with IcRn equal to 26 mV at 4.4 K. Conversely, the current-voltage characteristics of bridges patterned in the orthogonal [0 1 0] direction in the same films show flux-flow behaviour. This, coupled with the insensitivity of the inter-plane critical current to a small magnetic field, strongly suggests that the Josephson behaviour we have observed is due to intrinsic Josephson coupling between adjacent copper oxide planes, and not to extrinsic inter-grain coupling. (C) 1999 Elsevier Science B.V. All rights reserved. |
| Databáze: | OpenAIRE |
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