Comparison of MOSFET Gate Waffle Patterns Based on Specific On-Resistance
| Autor: | Vlastimil Kote, Jiri Jakovenko, Patrik Vacula, Miroslav Husak, M. Vacula, D. Barri, S. Privitera |
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| Rok vydání: | 2019 |
| Předmět: |
waffle MOSFET
Materials science business.industry Integrated circuit On resistance specific on-resistance law.invention law MOSFET Optoelectronics lcsh:Electrical engineering. Electronics. Nuclear engineering Electrical and Electronic Engineering Power MOSFET business integrated circuits lcsh:TK1-9971 |
| Zdroj: | Radioengineering, Vol 28, Iss 3, Pp 598-609 (2019) Radioengineering. 2019 vol. 28, č. 3, s. 598-609. ISSN 1210-2512 |
| ISSN: | 1210-2512 |
| DOI: | 10.13164/re.2019.0598 |
| Popis: | This article describes waffle power MOSFET segmentation and defines its analytic models. Although waffle gate pattern is well-known architecture for effective channel scaling without requirements on process modification, no until today precise model considering segmentation of MOSFETs with waffle gate patterns, due to bulk connections, has been there proposed. Two different MOSFET topologies with gate waffle patterns have been investigated and compared with the same on-resistance of a standard MOSFET with finger gate pattern. The first one with diagonal metal interconnections allows reaching more than 40 % area reduction. The second MOSFET with the more simple orthogonal metal interconnections allows saving more than 20 % area. Moreover, new models defining conditions where segmented power MOSFETs with waffle gate patterns occupy less area than the standard MOSFET with finger gate pattern, have been introduced. |
| Databáze: | OpenAIRE |
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