Matrix-Enhanced Secondary Ion Mass Spectrometry: A Method for Molecular Analysis of Solid Surfaces

Autor:	Kuang Jen Wu, Robert W. Odom
Rok vydání:	1996
Předmět:	Secondary ion mass spectrometry Static secondary-ion mass spectrometry Chemical ionization Protein mass spectrometry Chemistry Selected reaction monitoring Analytical chemistry Fast atom bombardment Mass spectrometry Sample preparation in mass spectrometry Analytical Chemistry
Zdroj:	Analytical Chemistry. 68:873-882
ISSN:	1520-6882 0003-2700
DOI:	10.1021/ac950717i
Popis:	A new methodology, matrix-enhanced secondary ion mass spectrometry (ME-SIMS), is reported for the molecular analysis of biomaterials. The technique applies static secondary ion mass spectrometry (SSIMS) techniques to samples prepared in a solid organic matrix similar to sample preparations used in matrix-assisted laser desorption/ionization (MALDI). Molecular ions are observed in this ion beam sputtering of organic mixtures for peptides and oligonucleotides up to masses on the order of 10 000 Da. This matrix-enhanced SIMS exhibits substantial increases in the ionization efficiency of selected analyte molecules compared to conventional SSIMS processes. Thus, higher mass peptides, proteins, and nucleic acids become accessible to near-surface analysis by ion beam techniques, and subpicomole sensitivity has been demonstrated. A number of matrices were examined for their efficiency in ME-SIMS applications, and these initial matrix studies focused on common MALDI matrices and their isomers. The results of this survey indicate that 2,5-dihydroxybenzoic acid provides the best general enhancement of molecular secondary ions emitted from analyte/matrix mixtures.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1a417fb36ff7a203af45be6a9304c55e https://doi.org/10.1021/ac950717i Zobrazit plný text záznamu