Humidity-Dependent Structure of Surface Water on Perfluorosulfonated Ionomer Thin Film Studied by Sum Frequency Generation Spectroscopy
| Autor: | Kohei Uosaki, Kento Taneda, Hideo Naohara, Hiroshi Minowa, Hidenori Noguchi |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2010 |
| Předmět: |
Materials science
Analytical chemistry Humidity Surfaces Coatings and Films Electronic Optical and Magnetic Materials chemistry.chemical_compound General Energy Adsorption chemistry Nafion Relative humidity Fluorocarbon Physical and Theoretical Chemistry Thin film Ionomer Sum frequency generation spectroscopy |
| Zdroj: | Journal of Physical Chemistry C. 114(9):3958-3961 |
| ISSN: | 1932-7447 |
| Popis: | Humidity-dependent water structure on the Nafion thin film surface was determined at room temperature by using sum frequency generation spectroscopy (SFG). When the Nafion thin film was exposed to a low relative humidity (RH) environment, a peak at 3720 cm^[-1] due to the "dangling OH" or "free OH" of water molecules and a peak centered around 3600 cm^[-1], which was assigned to be due to water molecules interacting with sulfonate groups of the Nafion surface, were observed. The intensities of these peaks increased as RH was increased. A broad peak centered around 3200-3300 cm^[-1] due to water adsorbed on hydrophobic, i.e., fluorocarbon, sites of Nafion was observed when the Nafion thin film was exposed to a high RH environment (RH > 60%). The behavior of surface water is compared with that of water in bulk Nafion. |
| Databáze: | OpenAIRE |
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