On the use of exchange biased top electrodes in magnetic tunnel junctions
| Autor: | Daniel Lacour, Frédéric Petroff, J. Humbert, Olivier Durand, Annie Vaures, Jean-Luc Maurice, F. Nguyen Van Dau, P. Etienne, H. Jaffrès |
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| Přispěvatelé: | Unité mixte de physique CNRS/Thales (UMPhy CNRS/THALES), Centre National de la Recherche Scientifique (CNRS)-THALES, Thales Research & Technology |
| Rok vydání: | 2004 |
| Předmět: |
Materials science
Tantalum chemistry.chemical_element 02 engineering and technology 01 natural sciences Magnetic tunnel junctions Tunnel effect Nuclear magnetic resonance Spin-dependent tunnelling Tunnel junction 0103 physical sciences Texture (crystalline) [PHYS.COND]Physics [physics]/Condensed Matter [cond-mat] Thin film 010302 applied physics Condensed matter physics PACS: 75.70.-i 61.66.-f 75.30.Gw Bilayer 021001 nanoscience & nanotechnology Condensed Matter Physics Electronic Optical and Magnetic Materials Exchange bias Ferromagnetism chemistry 0210 nano-technology |
| Zdroj: | Journal of Magnetism and Magnetic Materials Journal of Magnetism and Magnetic Materials, Elsevier, 2004, 270 (3), pp.403-406. ⟨10.1016/j.jmmm.2003.09.007⟩ |
| ISSN: | 0304-8853 |
| DOI: | 10.1016/j.jmmm.2003.09.007 |
| Popis: | International audience; We have investigated the magnetic behavior and the structural properties of ferromagnetic-antiferromagnetic systems (NiFe-IrMn and Co-IrMn) deposited directly on a thin tantalum buffer layer (bottom configuration) or above a thin Al 2 O 3 tunnel barrier layer (top configuration). In the bottom configuration, the bilayer system exhibits higher magnetic performances than in the top configuration in terms of thermal stability. We have performed a detailed structural study by X-ray diffraction and high-resolution transmission electron microscopy which allow us to establish a clear correlation between the situation of the bilayer with respect to the tunnel barrier, its texture and its magnetic properties. r |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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