Comprehensive topography characterization of polycrystalline diamond coatings
| Autor: | Lars Pastewka, Nicolaie Moldovan, Subarna Khanal, Antoine Sanner, Tevis D. B. Jacobs, Hongjun Zeng, Abhijeet Gujrati |
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| Jazyk: | angličtina |
| Rok vydání: | 2021 |
| Předmět: |
Length scale
Condensed Matter - Materials Science Materials science Scale (ratio) Process Chemistry and Technology Materials Science (cond-mat.mtrl-sci) FOS: Physical sciences Diamond 02 engineering and technology Surface finish engineering.material 021001 nanoscience & nanotechnology Grain size Surfaces Coatings and Films Characterization (materials science) 020303 mechanical engineering & transports 0203 mechanical engineering Transmission electron microscopy Materials Chemistry engineering Composite material 0210 nano-technology Instrumentation Scaling |
| Zdroj: | Surface Topography: Metrology and Properties |
| Popis: | The surface topography of diamond coatings strongly affects surface properties such as adhesion, friction, wear, and biocompatibility. However, the understanding of multi-scale topography, and its effect on properties, has been hindered by conventional measurement methods, which capture only a single length scale. Here, four different polycrystalline diamond coatings are characterized using transmission electron microscopy to assess the roughness down to the sub-nanometer scale. Then these measurements are combined, using the power spectral density (PSD), with conventional methods (stylus profilometry and atomic force microscopy) to characterize all scales of topography. The results demonstrate the critical importance of measuring topography across all length scales, especially because their PSDs cross over one another, such that a surface that is rougher at a larger scale may be smoother at a smaller scale and vice versa. Furthermore, these measurements reveal the connection between multi-scale topography and grain size, with characteristic scaling behavior at and slightly below the mean grain size, and self-affine fractal-like roughness at other length scales. At small (subgrain) scales, unpolished surfaces exhibit a common form of residual roughness that is self-affine in nature but difficult to detect with conventional methods. This approach of capturing topography from the atomic- to the macro-scale is termed comprehensive topography characterization, and all of the topography data from these surfaces has been made available for further analysis by experimentalists and theoreticians. Scientifically, this investigation has identified four characteristic regions of topography scaling in polycrystalline diamond materials. 13 pages, 6 figures |
| Databáze: | OpenAIRE |
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