Supplemental Material - Outlier Detection Using t-test in Rasch IRT Equating under NEAT Design

Autor: Liu, Chunyan, Jurich, Daniel
Rok vydání: 2022
Předmět:
DOI: 10.25384/sage.21052617.v1
Popis: Supplemental Material for Outlier Detection Using t-test in Rasch IRT Equating under NEAT Design by Chunyan Liu and Daniel Jurich in Applied Psychological Measurement
Databáze: OpenAIRE