Supplemental Material - Outlier Detection Using t-test in Rasch IRT Equating under NEAT Design
Autor: | Liu, Chunyan, Jurich, Daniel |
---|---|
Rok vydání: | 2022 |
Předmět: | |
DOI: | 10.25384/sage.21052617.v1 |
Popis: | Supplemental Material for Outlier Detection Using t-test in Rasch IRT Equating under NEAT Design by Chunyan Liu and Daniel Jurich in Applied Psychological Measurement |
Databáze: | OpenAIRE |
Externí odkaz: |