Properties of sputter-deposited Ni-Mn-Ga thin films
| Autor: | Volodymyr A. Chernenko, Michael Hagler, Peter Müllner, Stefano Besseghini, Makoto Ohtsuka, Francesco Stortiero |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2008 |
| Předmět: |
Materials science
Annealing (metallurgy) Mechanical Engineering Metallurgy Analytical chemistry Sputter deposition Condensed Matter Physics Magnetization Magnetic anisotropy MgO(0 0 1) wafer Mechanics of Materials Sputtering Electrical resistivity and conductivity Diffusionless transformation Martensitic transformation Ni-Mn-Ga thin film General Materials Science Thin film |
| Zdroj: | Materials science & engineering. A, Structural materials: properties, microstructure and processing 481 (2008): 271–274. doi:10.1016/j.msea.2006.12.206 info:cnr-pdr/source/autori:Chernenko V.A.; Besseghini S.; Hagler M.; Mullner P.; Ohtsuka M.; Stortiero F./titolo:Properties of sputter-deposited Ni-Mn-Ga thin films/doi:10.1016%2Fj.msea.2006.12.206/rivista:Materials science & engineering. A, Structural materials: properties, microstructure and processing/anno:2008/pagina_da:271/pagina_a:274/intervallo_pagine:271–274/volume:481 |
| DOI: | 10.1016/j.msea.2006.12.206 |
| Popis: | Sub-micrometer Ni–Mn–Ga films on MgO(0 0 1) single-crystalline wafers have been prepared by radio-frequency magnetron sputtering. The structural and magnetic states of the as-received (quasi-amorphous phase) and annealed (highly ordered martensitic phase at T = 300 K) films have been examined by X-ray diffraction, and measurements of resistivity and magnetization. The annealed films demonstrate a transformation behavior typical for the bulk and show a thickness dependence of the magnetic properties. |
| Databáze: | OpenAIRE |
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