Mutual interferometric characterization of a pair of independent electric fields

Autor:	Matthias M. Mang, Ilaria Gianani, Charles Bourassin-Bouchet, Ian A. Walmsley
Přispěvatelé:	Bourassin-Bouchet, C., Mang, M. M., Gianani, I., Walmsley, I. A.
Rok vydání:	2013
Předmět:	Physics Wavefront business.industry Phase (waves) Laser Interference (wave propagation) Atomic and Molecular Physics and Optics law.invention Characterization (materials science) Interferometry Optics law Electric field business Beam (structure)
Zdroj:	Optics Letters. 38:5299
ISSN:	1539-4794 0146-9592
DOI:	10.1364/ol.38.005299
Popis:	We demonstrate a novel interferometric characterization scheme that allows the complete reconstruction of two interfering electric fields. The phase profiles of both beams, and their relative phase, can be retrieved simultaneously as a function of any degree of freedom in which it is possible to shear one of the beams. The method has applications in wavefront sensing or ultrashort-pulse measurement, especially also in the domain of extreme light sources where it is difficult to generate a reference field or to replicate the beam in order to perform a self-referencing measurement. We demonstrate the technique experimentally by measuring simultaneously two ultrashort pulses in a single laser shot. © 2013 Optical Society of America.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1668c92f309a5f039f8c53c627c90aa4 https://doi.org/10.1364/ol.38.005299 Zobrazit plný text záznamu