Microstructure of Nanocrystalline Yttria-Doped Zirconia Thin Films Obtained by Sol-Gel Processing

Autor:	Reinhard Krüger, Benjamin Butz, Martina Luysberg, Ellen Ivers-Tiffée, Heike Störmer, Matthias Bockmeyer, Dagmar Gerthsen
Přispěvatelé:	Publica
Rok vydání:	2008
Předmět:	Microcrystalline Materials science Chemical engineering Materials Chemistry Ceramics and Composites Mineralogy Cubic zirconia Grain boundary Microstructure High-resolution transmission electron microscopy Yttria-stabilized zirconia Grain size Nanocrystalline material
Zdroj:	Journal of the American Ceramic Society. 91:2281-2289
ISSN:	1551-2916 0002-7820
DOI:	10.1111/j.1551-2916.2008.02400.x
Popis:	Nano- and microcrystalline yttria-stabilized zirconia (YSZ) thin films with a dopant concentration of 8.3 +/- 0.3 mol% Y2O3 were prepared with a variation in grain size by two orders of magnitude. A sol-gel-based method with consecutive rapid thermal annealing was applied to fabricate YSZ films, resulting in about 400 nm YSZ on sapphire substrates. The average grain sizes were varied between 5 nm and 0.5 mu m by heat treatment in the temperature range of 650 degrees-1350 degrees C for 24 h. High-resolution (HRTEM) and conventional transmission electron microscopy analyses confirmed specimens-irrespective of the thermal treatment-consisting of cubic (c-)ZrO2 grains with nanoscaled tetragonal precipitates coherently embedded in the cubic matrix. Energy-dispersive X-ray spectroscopy and HRTEM on a large number of specimens yielded a homogeneous yttria concentration within the grains and at the grain boundaries with the absence of impurities, i.e. silica at the grain boundaries.
Databáze:	OpenAIRE
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