PtyNAMi: ptychographic nano-analytical microscope

Autor: Dennis Brückner, Martin Seyrich, Gerald Falkenberg, Christian G. Schroer, Thomas L. Sheppard, Jan-Dierk Grunwaldt, Maria Scholz, Patrik Wiljes, Mikhail Lyubomirskiy, Maik Kahnt, Christina Ossig, Michael Stuckelberger, Andreas Schropp, Stephan Botta, Ralph Döhrmann, Jan Garrevoet, Yakub Fam, Felix Wittwer
Jazyk: angličtina
Rok vydání: 2020
Předmět:
Zdroj: Journal of applied crystallography, 53 (4), 957–971
Journal of applied crystallography 53(4), 957-971 (2020). doi:10.1107/S1600576720008420
Journal of Applied Crystallography
ISSN: 1600-5767
DOI: 10.1107/S1600576720008420
Popis: Journal of applied crystallography 53(4), 957 - 971 (2020). doi:10.1107/S1600576720008420
Ptychographic X-ray imaging at the highest spatial resolution requires an optimal experimental environment, providing a high coherent flux, excellent mechanical stability and a low background in the measured data. This requires, for example, a stable performance of all optical components along the entire beam path, high temperature stability, a robust sample and optics tracking system, and a scatter-free environment. This contribution summarizes the efforts along these lines to transform the nanoprobe station on beamline P06 (PETRA III) into the ptychographic nano-analytical microscope (PtyNAMi).
Published by Wiley-Blackwell, [S.l.]
Databáze: OpenAIRE