Strength of shock-loaded single-crystal tantalum [100] determined using in situ broadband x-ray Laue diffraction

Autor:	H.-S. Park, S. Rothman, A. J. Elsholz, P. Graham, Daniel Orlikowski, Bruce Remington, Matthew Suggit, N. Bazin, Paula Rosen, James Hawreliak, John Foster, A. J. Comley, Shon Prisbrey, Justin Wark, Brian Maddox, Nigel Park, Joe H. Satcher, Andrew Higginbotham, Robert E. Rudd, S. C. Peterson
Jazyk:	angličtina
Rok vydání:	2013
Předmět:	Range (particle radiation) Materials science business.industry X-ray Tantalum General Physics and Astronomy chemistry.chemical_element Molecular physics Measure (mathematics) Shock (mechanics) Crystal Condensed Matter::Materials Science Optics chemistry X-ray crystallography business Single crystal
Zdroj:	Physical review letters. 110(11)
ISSN:	1079-7114 0031-9007
Popis:	The strength of shock-loaded single crystal tantalum [100] has been experimentally determined using in situ broadband x-ray Laue diffraction to measure the strain state of the compressed crystal, and elastic constants calculated from first principles. The inferred strength reaches 35 GPa at a shock pressure of 181 GPa and is in excellent agreement with a multiscale strength model [N. R. Barton et al., J. Appl. Phys. 109, 073501 (2011)], which employs a hierarchy of simulation methods over a range of length scales to calculate strength from first principles.
Databáze:	OpenAIRE
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