Enhanced diffusion upon amorphous-to-nanocrystalline phase transition in Mo/B4C/Si layered systems

Autor:	Enrico G. Keim, Andrey E. Yakshin, Erwin Zoethout, Aart W. Kleyn, Franz Schäfers, H. H. Brongersma, V.I.T.A. de Rooij-Lohmann, M. Gorgoi, Frederik Bijkerk, R. W. E. van de Kruijs
Přispěvatelé:	Laser Physics & Nonlinear Optics, Faculty of Science and Technology
Rok vydání:	2010
Předmět:	Phase transition Materials science General Physics and Astronomy Nanocrystalline material Amorphous solid IR-75239 Crystallography Nanocrystal METIS-270289 Chemical physics Grain boundary diffusion coefficient EC Grant Agreement nr.: FP6/506008 Thin film Diffusion (business) Order of magnitude
Zdroj:	Journal of Applied Physics, 108, 5 Journal of Applied Physics, 108(1):014314, 014314/1-014314/5. American Institute of Physics
ISSN:	1089-7550 0021-8979
DOI:	10.1063/1.3460107
Popis:	The effect of an amorphous-to-nanocrystalline phase transition on the diffusion across an interface layer of subnanometer thickness has been investigated in real-time. The diffusion in the Mo/B4C/Si thin film structure studied was found to instantaneously enhance by an order of magnitude upon the formation of nanocrystals inducing the atomic-scale onset of grain boundary diffusion. (C) 2010 American Institute of Physics. [doi:10.1063/1.3460107]
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::151647a5f8dd7cc404625a76a3aab5ed https://doi.org/10.1063/1.3460107 Zobrazit plný text záznamu