Metadata schema to support FAIR data in scanning electron microscopy
| Autor: | Reetu Elza Joseph, Chauhan, A., Eschke, C., Ihsan, A. Z., Jalali, M., Jäntsch, U., Jung, N., Shyam Kumar, C. N., Kübel, C., Lucas, C., Mail, M., Mazilkin, A., Neidiger, C., Panighel, M., Sandfeld, S., Stotzka, R., Thelen, R., Aversa, R. |
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| Jazyk: | angličtina |
| Rok vydání: | 2021 |
| Předmět: | |
| Zdroj: | Scopus-Elsevier Supplementary Proceedings of the XXIII International Conference on Data Analytics and Management in Data Intensive Domains (DAMDID/RCDL 2021): Moscow, Russia, October 26-29, 2021. Ed.: A. Pozanenko |
| ISSN: | 1613-0073 |
| DOI: | 10.5445/ir/1000141604 |
| Popis: | The development and the adoption of metadata schemas and standards are a key aspect in data management. In this paper, we introduce our approach to a metadata model in the field of Materials Science. We present the specific use case of a metadata schema for Scanning Electron Microscopy, a characterization technique which is routinely used in Materials Science. This metadata schema is aiming to be a de-facto standard which will be openly available for reuse and further extension to other electron microscopy techniques. |
| Databáze: | OpenAIRE |
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