Charge-Noise Resilience of Two-Electron Quantum Dots in Si/SiGe Heterostructures
Autor: | Susan Coppersmith, Mark Friesen, Haşim Ekmel Ercan |
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Rok vydání: | 2021 |
Předmět: | |
Zdroj: | Physical review letters. 128(24) |
ISSN: | 1079-7114 |
Popis: | The valley degree of freedom presents challenges and opportunities for silicon spin qubits. An important consideration for singlet-triplet states is the presence of two distinct triplets, comprised of valley vs. orbital excitations. Here we show that both of these triplets are present in the typical operating regime, but that only the valley-excited triplet offers intrinsic protection against charge noise. We further show that this protection arises naturally in dots with stronger confinement. These results reveal an inherent advantage for silicon-based multi-electron qubits. Comment: 6 pages, 5 figures |
Databáze: | OpenAIRE |
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