Secondary ion and neutral mass spectrometry with swift heavy ions : Organic molecules
| Autor: | Lars Breuer, Markus Bender, Matthias Herder, Jordan O. Lerach, Andreas Wucher, Daniel Severin, F. Meinerzhagen |
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| Jazyk: | angličtina |
| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Chemistry Process Chemistry and Technology 02 engineering and technology Physik (inkl. Astronomie) 021001 nanoscience & nanotechnology Mass spectrometry 01 natural sciences Linear particle accelerator Surfaces Coatings and Films Electronic Optical and Magnetic Materials Ion Condensed Matter::Materials Science Swift heavy ion Beamline Physics::Plasma Physics Sputtering Universal linear accelerator Ionization 0103 physical sciences Materials Chemistry Electrical and Electronic Engineering Atomic physics 0210 nano-technology Instrumentation |
| Popis: | The authors report on experiments regarding the electronic and nuclear sputtering of organic films. The newly built swift heavy ion induced particle emission and surface modifications setup [Meinerzhagen et al., Rev. Sci. Instrum. 87, 013903 (2016)] at the M1 Branch at the universal linear accelerator (UNILAC) beam line at GSI in Darmstadt, Germany, has been used for research on organic molecules in the electronic sputtering regime. This setup has the unique capability not only to investigate electronically sputtered ions by projectiles with kinetic energies up to several giga-electron-volt but also to detect their neutral counterparts as well by laser postionization. For this purpose, the experiment is equipped with a laser system delivering 157 nm pulses with photon energies of 7.9 eV to be utilized in single photon ionization. In addition to the investigation of sputtered ions and neutrals in the electronic sputtering regime, a comparison of typical fragments between fundamentally different sputtering ... |
| Databáze: | OpenAIRE |
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