Tri-linear color multi-linescan sensor with 200 kHz line rate
| Autor: | Christian Nitta, Benjamin Bechen, Jörg Brodersen, Werner Brockherde, Olaf Schrey, Konrad Mayer, Ernst Bodenstorfer |
|---|---|
| Přispěvatelé: | Publica |
| Jazyk: | angličtina |
| Rok vydání: | 2016 |
| Předmět: |
Engineering
high-speed imaging multi-spectral imaging 02 engineering and technology 01 natural sciences tri-linear technology 020210 optoelectronics & photonics Aliasing Color gel 0103 physical sciences 0202 electrical engineering electronic engineering information engineering Materials Chemistry Electronic engineering Electrical and Electronic Engineering Image sensor Image resolution CMOS line-scan sensor 010302 applied physics CMOS sensor business.industry Rolling shutter Condensed Matter Physics Electronic Optical and Magnetic Materials CMOS CMOS image sensor color filter RGB color model business Computer hardware |
| Popis: | In this paper we present a newly developed linear CMOS high-speed line-scanning sensor realized in a 0.35 μm CMOS OPTO process for line-scan with 200 kHz true RGB and 600 kHz monochrome line rate, respectively. In total, 60 lines are integrated in the sensor allowing for electronic position adjustment. The lines are read out in rolling shutter manner. The high readout speed is achieved by a column-wise organization of the readout chain. At full speed, the sensor provides RGB color images with a spatial resolution down to 50 μm. This feature enables a variety of applications like quality assurance in print inspection, real-time surveillance of railroad tracks, in-line monitoring in flat panel fabrication lines and many more. The sensor has a fill-factor close to 100%, preventing aliasing and color artefacts. Hence the tri-linear technology is robust against aliasing ensuring better inspection quality and thus less waste in production lines. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|