Phase and Element Contents of the cBN Based Composites as Estimated by XPS

Autor:	Krystyna Lawniczak-Jablonska, I. N. Demchenko, Ewa Benko, E. Piskorska, Markku Heinonen
Rok vydání:	2004
Předmět:	Diffraction chemistry.chemical_compound Materials science X-ray photoelectron spectroscopy chemistry Boron nitride Phase (matter) Composite number Analytical chemistry Nanochemistry Composite material Phase analysis Analytical Chemistry
Zdroj:	Scopus-Elsevier
ISSN:	1436-5073 0026-3672
DOI:	10.1007/s00604-003-0146-6
Popis:	X-ray photoelectron spectroscopy (XPS) is used to estimate phase and element contents of the composites based on cubic boron nitride. A composite is a mixture of several compounds and the use of traditional X-ray diffraction for phase analysis in many cases can be difficult. By using XPS, we were able to evaluate the atomic concentration of elements and the content of different compounds of each element. SEM and XPS showed that samples are heterogeneous. The TiB2 phase, expecting from thermodynamic calculations, was formed in both investigated samples of cBN/Ti3SiC2/TiC but in different amount. The Ti3SiC2 additive was found more chemically active then TiC.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::10ca4fe0385e39f03621b9a4be7b0de4 https://doi.org/10.1007/s00604-003-0146-6 Zobrazit plný text záznamu Plný text ve formátu PDF