Study of the mechanisms involved in reactive silica

Autor: M.H. Tuilier, Frédéric Boinski, Lahcen Khouchaf
Přispěvatelé: École des Mines de Douai (Mines Douai EMD), Institut Mines-Télécom [Paris] (IMT), Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))
Rok vydání: 2010
Předmět:
Zdroj: Materials Chemistry and Physics
Materials Chemistry and Physics, 2010
ISSN: 0254-0584
DOI: 10.1016/j.matchemphys.2010.02.012
Popis: The microstructure of a heterogeneous SiO2 submitted to a depolymerisation process is studied using Transmission Electron Microscope (TEM), Environmental SEM (ESEM), and X-ray diffraction (XRD). With ESEM the formation of micro domain induced by the dissolution phenomena is shown. XRD shows the formation of a halo that is associated with the formation of amorphous phase. The parameters “position and FWHM” of the halo, enabled us to show the evolution of the disorderly phase when the reaction progresses. The hypothesis of formation of nanoparticles with different structural states was confirmed by the TEM.
Databáze: OpenAIRE