Combined characterization techniques to understand the stability of a variety of organic photovoltaic devices: the ISOS-3 inter-laboratory collaboration
Autor: | Dirk Vanderzande, Suren Gevorgyan, Eva Bundgaard, Monica Lira-Cantu, Roland Rösch, Harald Hoppe, Eszter Voroshazi, Frederik C. Krebs, Henrik Dam, Gerardo Teran-Escobar, Markus Hösel, David M. Tanenbaum, Laurence Lutsen, Matthew T. Lloyd, Kion Norrman, Mikkel Jørgensen, Martin Hermenau, Uli Würfel, Yulia Galagan, Morten Vesterager Madsen, Gülsah Y. Uzunoglu, Agnès Rivaton, Ronn Andriessen, Birger Zimmermann, David S. Germack, Birgitta Andreasen |
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Rok vydání: | 2012 |
Předmět: | |
Zdroj: | Digital.CSIC. Repositorio Institucional del CSIC instname |
ISSN: | 0277-786X |
DOI: | 10.1117/12.929579 |
Popis: | Trabajo presentado como comunicación al "Reliability of Photovoltaic Cells, Modules, Components, and Systems V" celebrada del 13 al 16 de Agosto del 2012 en San Diego (USA).-- et al. This work is part of the inter-laboratory collaboration to study the stability of seven distinct sets of state-of-the-art organic photovoltaic (OPVs) devices prepared by leading research laboratories. All devices have been shipped to and degraded at the Danish Technical University (DTU, formerly RISO-DTU) up to 1830 hours in accordance with established ISOS-3 protocols under defined illumination conditions. In this work we present a summary of the degradation response observed for the NREL sample, an inverted OPV of the type ITO/ZnO/P3HT:PCBM/PEDOT:PSS/Ag/Al, under full sun stability test. The results reported from the combination of the different characterization techniques results in a proposed degradation mechanism. The final conclusion is that the failure of the photovoltaic response of the device is mainly due to the degradation of the electrodes and not to the active materials of the solar cell. © (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only. |
Databáze: | OpenAIRE |
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