Impact of a defect trapping layer on the reliability of 1.3 μm quantum dot laser diodes grown on silicon

Autor:	M. Zenari, M. Buffolo, C. De Santi, C. Shang, E. Hughes, Y. Wan, R.W. Herrick, G. Meneghesso, E. Zanoni, J. Bowers, M. Meneghini
Jazyk:	angličtina
Rok vydání:	2022
Předmět:	Electrical and Electronic Engineering Safety Risk Reliability and Quality Condensed Matter Physics Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::10268e9e4fac7cb9bdc09972de840e49 https://hdl.handle.net/11577/3462163 Zobrazit plný text záznamu