Correcting the linear and nonlinear distortions for atomically resolved STEM spectrum and diffraction imaging
| Autor: | Kersten Hahn, Peter A. van Aken, Vesna Srot, Yi Wang, Ute Salzberger, Y. Eren Suyolcu, Wilfried Sigle |
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| Rok vydání: | 2018 |
| Předmět: |
spectrum image
Diffraction Materials science 02 engineering and technology Electron 01 natural sciences Article Optics Structural Biology 0103 physical sciences Scanning transmission electron microscopy Radiology Nuclear Medicine and imaging Instrumentation Spectrum imaging 010302 applied physics Shearing (physics) Pixel business.industry Spectrum (functional analysis) STEM 021001 nanoscience & nanotechnology Nonlinear system Computer Science::Computer Vision and Pattern Recognition scanning image distortion 0210 nano-technology business 4D-STEM mapping at high resolution |
| Zdroj: | Microscopy |
| ISSN: | 2050-5701 2050-5698 |
| Popis: | We report a software tool for post-correcting the linear and nonlinear image distortions of atomically resolved 3D spectrum imaging as well as 4D diffraction imaging. This tool improves the interpretability of distorted scanning transmission electron microscopy spectrum/diffraction imaging data. Specimen and stage drift as well as scan distortions can lead to a mismatch between true and desired electron probe positions in scanning transmission electron microscopy (STEM) which can result in both linear and nonlinear distortions in the subsequent experimental images. This problem is intensified in STEM spectrum and diffraction imaging techniques owing to the extended dwell times (pixel exposure time) as compared to conventional STEM imaging. As a consequence, these image distortions become more severe in STEM spectrum/diffraction imaging. This becomes visible as expansion, compression and/or shearing of the crystal lattice, and can even prohibit atomic resolution and thus limits the interpretability of the results. Here, we report a software tool for post-correcting the linear and nonlinear image distortions of atomically resolved 3D spectrum imaging as well as 4D diffraction imaging. This tool improves the interpretability of distorted STEM spectrum/diffraction imaging data. |
| Databáze: | OpenAIRE |
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