Mitigating Potential-Induced Degradation (PID) Using SiO2 ARC Layer
| Autor: | Nigel Schofield, Yihua Hu, Romênia Gurgel Vieira, Mahmoud Dhimish |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2020 |
| Předmět: |
current density
Control and Optimization Materials science 020209 energy Energy Engineering and Power Technology PID controller 02 engineering and technology engineering.material Potential induced degradation lcsh:Technology solar cells PID mitigation ARC electroluminescence imaging law.invention Arc (geometry) Coating law Solar cell 0202 electrical engineering electronic engineering information engineering Electrical and Electronic Engineering Composite material Engineering (miscellaneous) Renewable Energy Sustainability and the Environment lcsh:T Photovoltaic system 021001 nanoscience & nanotechnology engineering 0210 nano-technology Current density Energy (miscellaneous) Voltage |
| Zdroj: | Energies, Vol 13, Iss 5139, p 5139 (2020) Energies; Volume 13; Issue 19; Pages: 5139 |
| ISSN: | 1996-1073 |
| Popis: | Potential-induced degradation (PID) of photovoltaic (PV) cells is one of the most severe types of degradation, where the output power losses in solar cells may even exceed 30%. In this article, we present the development of a suitable anti-reflection coating (ARC) structure of solar cells to mitigate the PID effect using a SiO2 ARC layer. Our PID testing experiments show that the proposed ARC layer can improve the durability and reliability of the solar cell, where the maximum drop in efficiency was equal to 0.69% after 96 h of PID testing using an applied voltage of 1000 V and temperature setting at 85 °C. In addition, we observed that the maximum losses in the current density are equal to 0.8 mA/cm2, compared with 4.5 mA/cm2 current density loss without using the SiO2 ARC layer. |
| Databáze: | OpenAIRE |
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