Nitrogen redistribution in annealed LaFeOxNy thin films investigated by FTIR spectroscopy and EELS mapping
| Autor: | Victor Pierron, Emile Haye, Stéphanie Bruyère, Fabien Capon, Frans Munnik, Silvère Barrat |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2018 |
| Předmět: |
Materials science
Oxynitride perovskite Analytical chemistry General Physics and Astronomy chemistry.chemical_element 02 engineering and technology Activation energy 010402 general chemistry 01 natural sciences Fourier transform infrared spectroscopy Thin film Electron energy loss spectroscopy Surfaces and Interfaces General Chemistry Thermal stability Sputter deposition 021001 nanoscience & nanotechnology Condensed Matter Physics Nitrogen 0104 chemical sciences Surfaces Coatings and Films Elastic recoil detection chemistry FTIR Grain boundary EELS mapping 0210 nano-technology |
| Zdroj: | Applied Surface Science 427(2018), 1041-1045 |
| ISSN: | 0169-4332 |
| Popis: | LaFeOxNy thin films have been deposited by magnetron sputtering in Ar/O2/N2 gas mixture at 800 °C. Such oxynitride perovskites present a specific infrared vibration mode at 2040 cm−1, due to the presence of nitrogen, which disappears during heating in air. The loss of the vibration mode with temperature has been monitored allowing the determination of an activation energy of thermal degradation of LaFeOxNy. The quantification of nitrogen by Elastic Recoil Detection Analysis (ERDA) before and after heating exhibits the same nitrogen content. Such behavior is due to a nitrogen redistribution observed by Electron Energy Loss Spectroscopy (EELS) mapping, showing migration of nitrogen into grain boundaries, in association with the film oxidation. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full Text from ScienceDirect