Structured illumination microscopy using extraordinary transmission through sub-wavelength hole-arrays
Autor: | V.G. Kutchoukov, Paul F. A. Alkemade, O.M. Piciu, Yuval Garini, M.W. Docter, Ian T. Young, Andre Bossche, Peter M. van den Berg |
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Rok vydání: | 2007 |
Předmět: |
Microscope
Materials science business.industry Near-field optics Bright-field microscopy Extraordinary optical transmission Condensed Matter Physics near field optics far field imaging Electronic Optical and Magnetic Materials law.invention Optics extraordinary transmission law Microscopy microscopy Near-field scanning optical microscope business Image resolution Structured light |
Zdroj: | Journal of nanophotonics, 1.2007 |
ISSN: | 1934-2608 |
DOI: | 10.1117/1.2794786 |
Popis: | A new microscopy method for multi diffraction-limited spot illumination is based on extraordinary light transmission through a periodic metal grid (typical period of 600 nm) of sub-wavelength holes (150 nm). Multiple spots illuminate a fluorescently labeled sample and the emission is collected by far-field optics. Theoretical comparison with a confocal microscope reveals equivalent spot sizes and a scanning method with the advantage of multiple illumination spots. The system is used to measure the actual transmitted field with a fluorescent sample in far-field. The obtained results are consistent with the theoretical prediction and provide a proof of concept of the midfield microscope. |
Databáze: | OpenAIRE |
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