Creep-deformation behavior of (Mo 0.85 Nb 0.15 )Si 2 lamellar-structured C40/C11 b two-phase crystals
Autor: | Haruka Araki, Takayoshi Nakano, Takaaki Ikenishi, Koji Hagihara |
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Rok vydání: | 2016 |
Předmět: |
010302 applied physics
Materials science Polymers and Plastics Metals and Alloys 02 engineering and technology 021001 nanoscience & nanotechnology Microstructure 01 natural sciences Electronic Optical and Magnetic Materials Crystal Crystallography Lamella (surface anatomy) Creep Phase (matter) 0103 physical sciences Ceramics and Composites Lamellar structure Dislocation Composite material 0210 nano-technology Ternary operation |
Zdroj: | Acta Materialia. 107:196-212 |
ISSN: | 1359-6454 |
DOI: | 10.1016/j.actamat.2016.01.040 |
Popis: | The creep-deformation behavior of (Mo0.85Nb0.15)Si2 crystals that were composed of C40 and C11b two-phases with an oriented lamellar microstructure was examined over 1200–1400 °C under compression. The creep behavior of the crystals varied greatly depending on the orientation of the loading axis with respect to the lamellar interfaces. The steady-state creep strain rate (SSCR) when the loading orientation was parallel to the lamellar interfaces (0°-orientation) was approximately 2 orders of magnitude lower than that when the loading orientation was inclined by 45° (45°-orientation). Creep tests were performed also with single crystals of C40-single-phase (Mo0.85Nb0.15)Si2, and proved that the C40-phase effectively acts as a strengthening phase in the creep behavior of the C40/C11b duplex-phase crystals. The variant-1-type C11b phase grains, which have a loading orientation parallel to [001], were also found to act as an effective strengthening component. The SSCR of the 0°-orientation was succeeded to be further decreased by controlling the lamellar microstructure via the addition of Cr. The SSCR of the 1 at.%-Cr-added lamellar-structured crystal under 300 MPa in the 0°-orientation was approximately a third of that of the non-added ternary crystal. |
Databáze: | OpenAIRE |
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