Electron micrography and x-ray study of dip-lacquered LiF (220)

Autor:	Herbert W. Schnopper, Jacqueline Palmari, Monique Rasigni, Finn Erland Christensen, G. Rasigni, Allan Hornstrup
Rok vydání:	2010
Předmět:	X-ray spectroscopy Materials science business.industry Materials Science (miscellaneous) Surface finish Industrial and Manufacturing Engineering Microdensitometer Crystal Reflection (mathematics) Optics Absorption edge Surface roughness Business and International Management business Spectroscopy
Zdroj:	Applied optics. 30(25)
ISSN:	1559-128X
Popis:	It has been proposed to use the 220 reflection of LiF with a multilayer deposited upon the top for simultaneous spectroscopy near Fe-k and O-k and below the C-k absorption edge (284 eV) in x-ray astronomy. We demonstrate that a substantial reduction of surface roughness is obtained by dip lacquering state-of-the-art polished LiF(220) surfaces. Using a microdensitometer analysis of electron micrographs of surface replicas and x-ray reflection, we have measured approximately 10-A rms roughness of Au-coated dip-lacquered LiF(220) crystals, as opposed to approximately 60 A measured on the bare LiF(220) crystal surface.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0f44e4f9ea30ab3e9352be28b2947bb6 https://pubmed.ncbi.nlm.nih.gov/20706443 Zobrazit plný text záznamu