Atomic-scale quantification of charge densities in two-dimensional materials
| Autor: | Sebastian Ihle, Florian Winkler, Martin Simson, Andreas Rosenauer, Tim O. Wehling, Vadim Migunov, Rafal E. Dunin-Borkowski, Malte Rösner, Hao Yang, Robert Ritz, Sandra Van Aert, Knut Müller-Caspary, Heike Soltau, Martial Duchamp, Martin Huth |
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| Přispěvatelé: | School of Materials Science & Engineering |
| Jazyk: | angličtina |
| Rok vydání: | 2018 |
| Předmět: |
010302 applied physics
Materials science Solid-state physics Physics Bilayer Charge density Charge (physics) 02 engineering and technology 021001 nanoscience & nanotechnology Monolayer Films 01 natural sciences Molecular physics Atomic units Engineering::Materials [DRNTU] Transition-metal Dichalcogenide Electric field 0103 physical sciences Scanning transmission electron microscopy ddc:530 0210 nano-technology Electron scattering |
| Zdroj: | Physical review / B 98(12), 121408 (2018). doi:10.1103/PhysRevB.98.121408 Physical review B |
| ISSN: | 2469-9969 |
| DOI: | 10.1103/PhysRevB.98.121408 |
| Popis: | The charge density is among the most fundamental solid state properties determining bonding, electrical characteristics, and adsorption or catalysis at surfaces. While atomic-scale charge densities have as yet been retrieved by solid state theory, we demonstrate both charge density and electric field mapping across a mono-/bilayer boundary in 2D MoS2 by momentum-resolved scanning transmission electron microscopy. Based on consistency of the four-dimensional experimental data, statistical parameter estimation and dynamical electron scattering simulations using strain-relaxed supercells, we are able to identify an AA-type bilayer stacking and charge depletion at the Mo-terminated layer edge. Published version |
| Databáze: | OpenAIRE |
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