Low-temperature scanning-tunneling-microscopy observations of the Si(001) surface with a low surface-defect density

Autor:	Takaaki Amakusa, Masashi Iwatsuki, Hiroshi Tochihara
Rok vydání:	1994
Předmět:	Surface (mathematics) Materials science Condensed matter physics Buckling law Nanotechnology Scanning tunneling microscope law.invention
Zdroj:	Physical Review B. 50:12262-12265
ISSN:	1095-3795 0163-1829
DOI:	10.1103/physrevb.50.12262
Popis:	We have settled a controversy that surface dimers in the Si(001) surface are intrinsically symmetric or asymmetric. Atom-resolved scanning-tunneling-microscopy (STM) images of a low-defect-density (\ensuremath{\sim}1%) surface at 144 K give definite evidence for the asymmetric-dimer model. We have identified a local influence of surface defects on buckling of dimers at low temperatures, which was not clarified in previous STM observations at 120 K.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0e65415555e3ddf190ab582fc0b78927 https://doi.org/10.1103/physrevb.50.12262 Zobrazit plný text záznamu