Thermionic emission microscopy of scandium thin film dewetting on W(100)
| Autor: | Martin E. Kordesch, T. V. Savina, Samuel A. Tenney, Michael V. Mroz |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
010302 applied physics
Materials science Analytical chemistry General Physics and Astronomy chemistry.chemical_element Thermionic emission 02 engineering and technology Tungsten 021001 nanoscience & nanotechnology 01 natural sciences lcsh:QC1-999 chemistry Sputtering 0103 physical sciences Microscopy Scandium Wetting Dewetting Thin film 0210 nano-technology lcsh:Physics |
| Zdroj: | AIP Advances, Vol 8, Iss 6, Pp 065114-065114-6 (2018) |
| ISSN: | 2158-3226 |
| DOI: | 10.1063/1.5039612 |
| Popis: | Scandium thin films of 5-30 nm thickness deposited on clean W(100) surfaces de-wet from the tungsten surface when heated to temperatures < 0.5 Tmelt. The dewetting temperature and the resulting droplet size are a function of the initial scandium film thickness.Scandium thin films of 5-30 nm thickness deposited on clean W(100) surfaces de-wet from the tungsten surface when heated to temperatures < 0.5 Tmelt. The dewetting temperature and the resulting droplet size are a function of the initial scandium film thickness. |
| Databáze: | OpenAIRE |
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