Bit-Flip Detection-Driven Selection of Trace Signals
| Autor: | Nicola Nicolici, Amin Vali |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
Computer science
media_common.quotation_subject Real-time computing 02 engineering and technology computer.software_genre 01 natural sciences 0103 physical sciences 0202 electrical engineering electronic engineering information engineering Effective method System on a chip Electrical and Electronic Engineering Selection algorithm Selection (genetic algorithm) media_common TRACE (psycholinguistics) 010302 applied physics Focus (computing) Computer Graphics and Computer-Aided Design 020202 computer hardware & architecture Identification (information) Debugging Computer engineering Software bug Logic gate 020201 artificial intelligence & image processing Electronic design automation Data mining computer Software |
| Zdroj: | ETS |
| ISSN: | 1937-4151 0278-0070 |
| DOI: | 10.1109/tcad.2017.2729458 |
| Popis: | Since integrating memory blocks on-chip became affordable, embedded logic analysis has been used extensively for post-silicon validation and debugging. Deciding at design time which signals to be traceable at the post-silicon phase, has been posed as an algorithmic problem a decade ago. The primary focus of the subsequent approaches on this topic was to restore as much data as possible within a software simulator in order to facilitate the analysis of functional bugs, assuming there are no electrically induced design errors, e.g., bit-flips. In this paper, we show that analyzing post-silicon traces can also aid with the identification bit-flips. We present a new trace signals selection algorithm that is driven by the detection of bit-flips. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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