In Situ Stress Measurement of Electrodeposited Ni Films by Television Holographic Interferometry

Autor:	Hitoshi Matsuda, Satoshi Kakunai, Naoki Fukumuro, Shinji Yae, Takayoshi Do
Rok vydání:	2010
Předmět:	Materials science Optics business.industry In situ stress business Holographic interferometry
Zdroj:	ECS Transactions. 25:27-34
ISSN:	1938-6737 1938-5862
DOI:	10.1149/1.3335489
Popis:	In situ stress measurements of electrodeposited Ni films from a sulfate bath during deposition were carried out by television holographic interferometry. The effect of the addition of saccharin sodium on the internal stress in the Ni films was studied. Structure change with film growth was investigated by cross-sectional TEM observation. Quantitative analysis of impurities and hydrogen in films was performed. The stress behaviors of Ni films changed drastically from a tensile direction to a compressive direction with an increase of the concentration of saccharin sodium.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0ddbd05a340df3d98e0d46e8e3e3d1c5 https://doi.org/10.1149/1.3335489 Zobrazit plný text záznamu